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Physics Colloquium : Multi-microscopy of defects in nitride semiconductors

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Speaker: Talk by Prof. Rachel Oliver, Invited by Prof. Susanne Siebentritt
Event date: Wednesday, 29 April 2020 04:00 pm - 05:00 pm
Place: Campus Belval
Maison du Savoir - room 3.370

Multi-microscopy is an approach to the nanoscale analysis of the structure and properties of materials in which different microscopy techniques are brought to bear on exactly the same nanoscale structure, revealing more about its characteristics than any individual technique could achieve alone.  Here, we focus on the combination of scanning probe microscopy (SPM), transmission electron microscopy (TEM) and cathodoluminescence (CL) in the scanning electron microscope (SEM) including the recently developed time-resolved CL technique. In order to effectively bring these diverse microscopies to bear on exactly the same nanoscale defect specific protocols and specialist sample preparation techniques have been developed.  These methods, and the advantages of the multi-microscopy approach will be demonstrated by studies of defects in nitride semiconductor structures relevant to light emitting diodes (LEDs) and other devices.


Bio :

Prof. Rachel Oliver's research focusses on nitride semiconductors - the materials used in an ever-increasing range of optoelectronic applications from the blue laser diodes inside a "Bluray" player, to the energy efficient LED bulbs which are helping cut greenhouse gas emissions across the globe. Rachel's focus is on understanding how the small scale structure of nitride materials effects the performance and properties of devices. She uses expertise in microscopy and materials growth to develop new nanoscale nitride structures which will provide new functionality to the devices of the future.

Rachel studied Materials Science at Oxford. After her Ph.D. she moved to Cambridge, where she became a Reader in 2013.


Data: 2020_04_29_Oliver Rachel_Colloquium.pdf 151.56 kB